Backtracking Depth-Resolved Microstructures for Crystal Plasticity Identification-Part 1: Backtracking Microstructures

Shi, QW; Latourte, F; Hild, F; Roux, S

Shi, QW (reprint author), Univ Paris Saclay, CNRS, ENS Paris Saclay, LMT, 61 Ave President Wilson, F-94235 Cachan, France.; Shi, QW (reprint author), EDF R&D, Site Renardieres, Ave Renardieres, F-77818 Moret Sur Loing, France.

JOM, 2017; 69 (12): 2810

Abstract

In situ mechanical tests performed on polycrystalline materials in a scanning electron microscope suffer from the lack of information on depth-resolve......

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