Pattern Reconstructability in Fully Parallel Thinning

Chen, YS; Chao, MT

Chen, YS (reprint author), Yuan Ze Univ, Dept Elect Engn, Taoyuan 320, Taiwan.

JOURNAL OF IMAGING, 2017; 3 (3):

Abstract

It is a challenging topic to perform pattern reconstruction from a unit-width skeleton, which is obtained by a parallel thinning algorithm. The bias s......

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