Test Methodology for Defect-Based Bridge Faults

Chang, SW; Nien, YT; Hu, YP; Wu, KC; Wang, CC; Huang, FS; Tang, YL; Chen, YC; Chen, MC; Chao, MCT

Nien, YT (通讯作者),Natl Yang Ming Chiao Tung Univ, Inst Elect, Hsinchu 300, Taiwan.

IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2022; 30 (7): 975