One-Class Fault Detection Using Multi-Layer Elm-Based Auto-Encoder

Li, WK; Yin, GL; Chen, XX

Yin, GL (corresponding author), Yongzhou Vocat Tech Coll, Yongzhou 425000, Hunan, Peoples R China.

INTERNATIONAL JOURNAL OF COMPUTATIONAL INTELLIGENCE AND APPLICATIONS, 2021; 20 (1):

Abstract

A new approach for one-class fault detection trained only by normal samples has been proposed in this paper. The approach contains multi-anterior-laye......

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