A Trapezoidal Cross-Section Stacked Gate FinFET with Gate Extension for Improved Gate Control

Mangesh, S; Chopra, P; Saini, KK

Mangesh, S (reprint author), Dr APJ Abdul Kalam Tech Univ Lucknow, Lucknow, Uttar Pradesh, India.

INTERNATIONAL JOURNAL OF ADVANCED COMPUTER SCIENCE AND APPLICATIONS, 2019; 10 (1): 189

Abstract

An improved trapezoidal pile gate bulk FinFET device is implemented with an extension in the gate for enhancing the performance. The novelty in the de......

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