Mission profile-based assessment of semiconductor technologies for automotive applications

Ahari, A; Viehl, A; Bringmann, O; Rosenstiel, W

Ahari, A; Viehl, A (reprint author), FZI Forschungszentrum Informat, Microelect Syst Design SiM, Haid & Neu Str 10-14, D-76131 Karlsruhe, Germany.; Ahari, A (reprint author), Eberhard Karls Univ Tubingen, Lehrstuhl Eingebettete Syst, Sand 13, D-72076 Tubi

MICROELECTRONICS RELIABILITY, 2018; 91 (): 129

Abstract

Semiconductor technology has to be qualified under the harsh temperature conditions required by the AEC-Q100 qualification standard before it is appli......

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