Structured illumination microscopy artefacts caused by illumination scattering

Mo, YQ; Feng, F; Mao, H; Fan, JC; Chen, LY

Chen, LY (corresponding author), Peking Univ, Sch Future Technol, Inst Mol Med, State Key Lab Membrane Biol,Beijing Key Lab Cardi, Beijing 100871, Peoples R China.; Fan, JC (corresponding author), Chongqing Univ Posts & Telecommun, Coll Comp Sci & Technol, Chongqing Key Lab Image Cognit, Chongqing 400065, Peoples R China.; Chen, LY (corresponding author), PKU IDG McGovern Inst Brain Res, Beijing 100871, Peoples R China.; Chen, LY (corresponding author), Beijing Acad Artificial Intelligence, Beij

PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 2021; 379 (2199):

Abstract

Despite its wide application in live-cell super-resolution (SR) imaging, structured illumination microscopy (SIM) suffers from aberrations caused by v......

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