TBFormer: Two-Branch Transformer for Image Forgery Localization

Liu, YQ; Lv, BB; Jin, X; Chen, XY; Zhang, XK

Jin, X (通讯作者),Beijing Elect Sci & Technol Inst, Beijing 100070, Peoples R China.

IEEE SIGNAL PROCESSING LETTERS, 2023; 30 (): 623

Abstract

Image forgery localization aims to identify forged regions by capturing subtle traces from high-quality discriminative features. In this paper, we pro......

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