On Holder Projective Divergences

Nielsen, F; Sun, K; Marchand-Maillet, S

Nielsen, F (reprint author), Ecole Polytech, Comp Sci Dept LIX, F-91128 Palaiseau, France.; Nielsen, F (reprint author), Sony Comp Sci Labs Inc, Tokyo 1410022, Japan.

ENTROPY, 2017; 19 (3):

Abstract

We describe a framework to build distances by measuring the tightness of inequalities and introduce the notion of proper statistical divergences and i......

Full Text Link