DC and RF characterization of RF MOSFET embedding structure

Takeshige, A; Katayama, K; Amakawa, S; Takano, K; Yoshida, T; Fujishima, M

Amakawa, S (reprint author), Hiroshima Univ, Grad Sch Adv Sci Matter, 1-3-1 Kagamiyama, Higashihiroshima, Hiroshima 7398530, Japan.

2017 INTERNATIONAL CONFERENCE OF MICROELECTRONIC TEST STRUCTURES (ICMTS), 2017; ( ):

Abstract

It is not so easy to correlate DC Kelvin measurement data of an RF transistor and its non-Kelvin RF measurement data, because the actual bias voltages......

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