Memory mutation testing

Wu, F; Nanavati, J; Harman, M; Jia, Y; Krinke, J

Wu, F (reprint author), UCL, CREST, London WC1E 6BT, England.

INFORMATION AND SOFTWARE TECHNOLOGY, 2017; 81 ( ): 97

Abstract

Context Three decades of mutation testing development have given software testers a rich set of mutation operators, yet relatively few operators can t......

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