A Survey of Test and Reliability Solutions for Magnetic Random Access Memories

Girard, P; Cheng, YQ; Virazel, A; Zhao, WS; Bishnoi, R; Tahoori, MB

Girard, P (corresponding author), Univ Montpellier, CNRS, Lab Comp Sci Robot & Microelect Montpellier LIRMM, F-34095 Montpellier, France.

PROCEEDINGS OF THE IEEE, 2021; 109 (2): 149

Abstract

Memories occupy most of the silicon area in nowadays' system-on-chips and contribute to a significant part of system power consumption. Though widely ......

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