Metasurface Enhanced AFM Cantilevers

Speet, B; Silvestri, F; Gerini, G; Tabari, SM; Sadeghian, H

Speet, B (reprint author), TNO, Opt Dept, Stieltjesweg 1, NL-2628 CK Delft, Netherlands.

METAMATERIALS XI, 2018; 10671 ():

Abstract

In this contribution, we present the application of an optical metasurface polarization rotator in an Atomic Force Microscopy (AFM) setup. In AFM, the......

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