Accurate photonic waveguide characterization using an arrayed waveguide structure

Gehl, M; Boynton, N; Dallo, C; Pomerene, A; Starbuck, A; Hood, D; Trotter, DC; Lentine, A; DeRose, CT

Gehl, M (reprint author), Sandia Natl Labs, Appl Photon Microsyst, 1515 Eubank SE, Albuquerque, NM 87123 USA.

OPTICS EXPRESS, 2018; 26 (14): 18082

Abstract

Measurement uncertainties in the techniques used to characterize loss in photonic waveguides becomes a significant issue as waveguide loss is reduced ......

Full Text Link