Interface Discrete Trap Induced Variability for Negative Capacitance FinFETs

Lee, HP; Tseng, KY; Su, P

Lee, HP (reprint author), Natl Chiao Tung Univ, Dept Elect Engn, Hsinchu, Taiwan.

2018 INTERNATIONAL SYMPOSIUM ON VLSI TECHNOLOGY, SYSTEMS AND APPLICATION (VLSI-TSA), 2018; ():

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