Window Effects in HBM and TLP Testing

Smedes, T; Scheucher, W; Abessolo-Bidzo, D

Smedes, T (reprint author), NXP Semicond, Gerstweg 2, NL-6534 AE Nijmegen, Netherlands.

2017 39TH ELECTRICAL OVERSTRESS/ELECTROSTATIC DISCHARGE SYMPOSIUM (EOS/ESD), 2017; ( ):

Abstract

We present a study of products showing systematic window effects during HBM and TLP testing. It is shown that the window effects are mainly the conseq......

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