Membrane-Based Scanning Force Microscopy

Halg, D; Gisler, T; Tsaturyan, Y; Catalini, L; Grob, U; Krass, MD; Heritier, M; Mattiat, H; Thamm, AK; Schirhagl, R; Langman, EC; Schliesser, A; Degen, CL; Eichler, A

Eichler, A (corresponding author), Swiss Fed Inst Technol, Lab Solid State Phys, CH-8093 Zurich, Switzerland.

PHYSICAL REVIEW APPLIED, 2021; 15 (2):

Abstract

We report the development of a scanning force microscope based on an ultrasensitive silicon nitride membrane optomechanical transducer. Our developmen......

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