Detail-Preserving Self-Supervised Monocular Depth with Self-Supervised Structural Sharpening

Bello, JLG; Moon, J; Kim, M

Bello, JLG (通讯作者),Korea Adv Inst Sci & Technol, Daejeon, South Korea.

2023 IEEE/CVF CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION WORKSHOPS, CVPRW, 2023; (): 254

Abstract

We propose to further close the gap between self-supervised and fully-supervised methods for the single view depth estimation (SVDE) task in terms of ......

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