Stealthy Backdoors as Compression Artifacts

Tian, YL; Suya, F; Xu, FY; Evans, D

Evans, D (通讯作者)，Univ Virginia, Dept Comp Sci, Charlottesville, VA 22904 USA.

IEEE TRANSACTIONS ON INFORMATION FORENSICS AND SECURITY, 2022; 17 (): 1372

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