Light scattered or radiated from a material carries valuable information on the said material. Such information can be uncovered by measuring the ligh......
Cai, GY; Li, YH; Zhang, Y; Jiang, X; Chen, YM; Qu, GY; Zhang, XD; Xiao, SM; Han, JC; Yu, SH; Kivshar, Y; Song, QH
Xiao, SM; Song, QH (通讯作者),Harbin Inst Technol, Minist Ind & Informat Technol, Guangdong Prov Key Lab Semicond Optoelect Mat & In, Key Lab Micronano Optoelect Informat Syst, Shenzhen, Peoples R China.;Xiao, SM; Yu, SH; Song, QH (通讯作者),Pengcheng Lab, Shenzhen, Peoples R China.;Xiao, SM (通讯作者),Harbin Inst Technol, Natl Key Lab Sci & Technol Adv Composites Special, Harbin, Peoples R China.;Kivshar, Y (通讯作者),Australian Natl Univ, Res Sch Phys, Nonlinear Phys Ctr, Canberra, ACT, Australia.;Kivshar, Y (通讯作者),Harbin Engn Univ, Qingdao Innovat & Dev Ctr, Qingdao, Peoples R China.;Song, QH (通讯作者),Shanxi Univ, Collaborat Innovat Ctr Extreme Opt, Taiyuan, Peoples R China.
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