Characteristics of Failure Schottky Barrier Diode and PN Junction Diode for Bypass Diode using Induced Lightning Serge Test

Hamada, T; Nakamoto, K; Nanno, I; Fujii, M; Oke, S; Ishikura, N

Hamada, T (reprint author), Natl Inst Technol, Dept Elect Engn, Ube Coll, 2-14-1 Tokiwadai, Ube, Yamaguchi, Japan.

2018 7TH INTERNATIONAL CONFERENCE ON RENEWABLE ENERGY RESEARCH AND APPLICATIONS (ICRERA), 2018; (): 482

Abstract

In a solar power generation module, when a bypass diode (BPD) with a resistance ranging between 0.1-10 Omega is damaged by a lightning surge, a circul......

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