Experiment and analysis of repetitive avalanche low-current stress on 4H-SiC power devices-MedSci.cn

Experiment and analysis of repetitive avalanche low-current stress on 4H-SiC power devices

Yuan, H; Liu, YC; Luo, JT; He, XN; Tang, XY; Zhang, TS; Zhang, YM; Zhang, YM; Song, QW

Tang, XY; Song, QW (通讯作者)，Xidian Univ, Sch Microelect, Xian 710071, Peoples R China.

SOLID-STATE ELECTRONICS, 2022; 193 ():

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