Highly Accelerated Life Test Evaluation Based on Accelerated Growth Model

Gao, YK; Niu, L; Li, XG

Li, XG (reprint author), Beihang Univ, Sch Reliabil & Syst Engn, Beijing, Peoples R China.

2018 IEEE 18TH INTERNATIONAL CONFERENCE ON SOFTWARE QUALITY, RELIABILITY AND SECURITY COMPANION (QRS-C), 2018; (): 645

Abstract

Highly accelerated life test has been widely used to improve the quality and reliability of electronic products. However, highly accelerated life test......

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