Design, Simulation, and Experimental Verification of a Destruction Mechanism of Transient Electronic Devices

Xiao, Y; Zhang, ZY; Liao, XY; Jiang, FY; Wang, Y

Zhang, ZY (corresponding author), Sci & Technol Analog Integrated Circuit Lab, Chongqing 400060, Peoples R China.

ACTIVE AND PASSIVE ELECTRONIC COMPONENTS, 2020; 2020 ():

Abstract

To quickly destroy electronic devices and ensure information security, a destruction mechanism of transient electronic devices was designed in this pa......

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