Comparative Study of Reliability of Ferroelectric and Anti-Ferroelectric Memories

Pesic, M; Schroeder, U; Slesazeck, S; Mikolajick, T

Pesic, M (reprint author), Namlab gGmbH, D-01187 Dresden, Germany.

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2018; 18 (2): 154

Abstract

With the discovery of the ferroelectric (FE) properties within HfO2, the scaling gap between state-of-the-art technology nodes and non-volatile memori......

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