Abstract
Asad, M; Majdi, S; Vorobiev, A; Jeppson, K; Isberg, J; Stake, J
Asad, M (通讯作者),Chalmers Univ Technol, Dept Microtechnol & Nanosci, S-41296 Gothenburg, Sweden.
IEEE ELECTRON DEVICE LETTERS, 2022; 43 (2): 300