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IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

出版年份:暂无数据 年文章数:1174 投稿命中率: 开通期刊会员,数据随心看

出版周期:Quarterly 自引率:11.3% 审稿周期: 开通期刊会员,数据随心看

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投稿信息
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中国人发表比例
2023年中国人文章占该期刊总数量暂无数据 (2022年为100.00%)
自引率
11.3 %
年文章数
1174
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期刊简介
稿件收录要求
Published by IEEE. ISSN: 1530-4388.

An on-line publication providing leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It will focus on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the manufacture of these devices; and the interfaces and surfaces of these materials. All issue topics are carefully chosen through the input of experienced professionals from both academic and industrial sectors. The manuscripts are passed through a special review process to ensure high technical content and that they are of interest to the special issue audience.