X-Ray Spectrometry is devoted to the rapid publication of papers dealing with the theory and application of x-ray spectrometry. Included within the terms of reference of the journal will be the use of sources based on electrons, x-ray photons, protons and gamma and gamma -x sources. Both wavelength and energy dispersion systems will be included, and data handling methods will range from the most simple to very sophisticated software programs up to the stage of providing analytical data, i.e. excluding process control software. It is also the intention to include papers dealing with the application of x-ray spectrometric methods for structural analysis (papers which deal primarily with x-ray diffraction are not appropriate).